SCANNING CURRENT SPECTROSCOPY: A CONDUCTING PROBE ATOMIC FORCE MICROSCOPY TECHNIQUE FOR EXPLORING THE PHYSICAL AND ELECTRONIC PROPERTIES OF METAL OXIDE/ORGANIC INTERFACES
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- - Academic And Stem
- - Applied And Theoretical Physics
- - Biosciences
- - Chemistry And Materials Science
- - Computer Science, It & Applications
- - Earth System Sciences: Geography & Geology
- - Economics And Business Studies
- - Educational Research, Teaching And Learning
- - Environmental Engineering And Science
- - Ethics And Philosophy
- - Historical And Archaeological Studies
- - Journalism, Media And Digital Communication
- - Language Studies And Linguistic Sciences
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- - Mathematics, Probability And Statistics
- - Mechanical And Manufacturing Engineering
- - Medical And Biomedical Research
- - Nutrition And Food: Science And Technology
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- - Psychology And Mental Health
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- - Structural, Geotechnical And Civil Engineering
Book Details :
SCANNING CURRENT SPECTROSCOPY: A CONDUCTING PROBE ATOMIC FORCE MICROSCOPY TECHNIQUE FOR EXPLORING THE PHYSICAL AND ELECTRONIC PROPERTIES OF METAL OXIDE/ORGANIC INTERFACES